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VLSI Test Principles and Architectures: Design for Testability 1st Edition

by Laung-Terng Wang (Author), Cheng-Wen Wu (Author), Xiaoqing Wen (Author)
4.9 4.9 out of 5 stars 21 ratings
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Purchase options and add-ons

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
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Previous page
  1. ISBN-10
    1493300865
  2. ISBN-13
    978-1493300860
  3. Edition
    1st
  4. Publication date
    July 21, 2006
  5. Language
    English
  6. Dimensions
    7.5 x 1.83 x 9.35 inches
  7. Print length
    808 pages
  8. See all details
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Amazon First Reads | Editors' picks at exclusive prices

Editorial Reviews

Review

In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.

Michel Renovell, Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France

This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.

Hans-Joachim Wunderlich, University of Stuttgart, Germany


Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs.

Andre Ivanov, University of British Columbia, Canada

This is the most recent book covering all aspects of digital systems testing. It is a “must read for anyone focused on learning modern test issues, test research, and test practices.

Kewal K. Saluja, University of Wisconsin-Madison


By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills.

Yihe Sun, Tsinghua University, Beijing, China

About the Author

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Product details

  • Publisher ‏ : ‎ Morgan Kaufmann; 1st edition (July 21, 2006)
  • Language ‏ : ‎ English
  • Paperback ‏ : ‎ 808 pages
  • ISBN-10 ‏ : ‎ 1493300865
  • ISBN-13 ‏ : ‎ 978-1493300860
  • Item Weight ‏ : ‎ 3.76 pounds
  • Dimensions ‏ : ‎ 7.5 x 1.83 x 9.35 inches
  • Customer Reviews:
    4.9 4.9 out of 5 stars 21 ratings

Customer reviews

4.9 out of 5 stars
4.9 out of 5
21 global ratings

Top reviews from the United States

Steven Bridges
5.0 out of 5 stars Great general reference
Reviewed in the United States on June 7, 2021
Verified Purchase
Ah DFT, the red headed step child of semiconductors....

I am a digital designer/architect doing most of the front end design flows including JTAG and DFT insertion when synthesizing. I knew the general basics of DFT, however this book has been immensely helpful in understanding some of the "why's" and "how's". DFT is a career in itself, and understanding the EDA aspect and how to use the tools is something in it's own regard. This book won't explain how to use a particular tool, but will give you the foundation for understanding the methodology behind certain DFT related aspects, and probably most importantly, how a design is tested from IP to SoC. In some cases it can deter you from trying to spin a homebrew DFT solution such as MBIST in favor of something commercial depending on your production level. As with anything engineering related, this book will give you an example at a high level and not explain the low level details. Considering each company has their own way of doing things, this is to be expected. Even if you aren't involved with the DFT design/insertion/testing aspect, it would still benefit any designer to at least have this as a reference for understanding why that guy down the hall asks you to make a change to your design so he can increase the coverage, or make the test vector a little easier to deal with. He's not being annoying or lazy, he's just a DFT guy, and after referencing this book, you're likely to buy him a coffee instead of scold him :).
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Duncan M. Walker
5.0 out of 5 stars An Excellent Textbook
Reviewed in the United States on January 11, 2015
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I co-authored a chapter, so I am biased. But I use this book in my graduate test class. It is an excellent text for covering all of the fundamentals of integrated circuit testing - basic design-for-test, and algorithms for test generation and fault simulation.
One person found this helpful
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Darth Vadar
5.0 out of 5 stars Practical Book
Reviewed in the United States on November 12, 2006
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This is a great book for Test/DFT engineers and EDA engineers developing test tool. It gives a thorough review of lot of concepts and techniques employed in practice which cannot be found if you look at a general testing book. This also makes it an excellent resource to prepare for interviews.
7 people found this helpful
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Simian Guide
5.0 out of 5 stars Very Practical Book
Reviewed in the United States on June 14, 2013
I have been reading this book for my new role as a DFT Engineer. I must say the concept in this book are very practical. I have been using this book as a reference book along side the requirements of the chip and it has been an invaluable resource.

I will definitely recommend this book to anyone trying to understand DFT principles or use it as s refernce as part of DFT engineer role.

Cheers...
3 people found this helpful
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Top reviews from other countries

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Pinkesh
5.0 out of 5 stars Five Stars
Reviewed in India on October 2, 2017
Verified Purchase
Love this book. Very good to get started OR have more expertise on DFT.
One person found this helpful
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S. aus B.
5.0 out of 5 stars Dicke Schwarte
Reviewed in Germany on December 28, 2011
Verified Purchase
Habe mir das Buch zur Prüfungsvorbereitung gekauft, hat sehr gut geholfen! :)
Und! konnte es danach sogar einigermaßen erfolgreich weiterverkaufen...
Naja, es ist halt ein Standartwerk zu diesem doch sehr speziellen Thema, und auch nicht ganz billig.
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vibhor
5.0 out of 5 stars Five Stars
Reviewed in India on April 30, 2018
Verified Purchase
Nice read for all basic topics
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anirudh mathur
5.0 out of 5 stars Nice one
Reviewed in India on May 15, 2016
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Perfect book to get some theoretical knowledge about DFT concepts.
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apoorav
4.0 out of 5 stars very useful
Reviewed in India on June 14, 2016
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very good book
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